发明名称 PLASMA ETCHING APPARATUS
摘要 A reactive ion plasma etching apparatus having an electrode (12), for holding the product, such as a semiconductor wafer (33, 53), to be etched, provided with a plurality of apertures (15, 15a, 15b) into which different tailored product holders are inserted so as to alter the plasma over each holder and provide more uniform etching of the product in the holder regardless of its position on the electrode (12). The holders, like holders (30) and (51), have preferably a recess or a mesa for supporting the wafers.
申请公布号 DE3570805(D1) 申请公布日期 1989.07.06
申请号 DE19853570805 申请日期 1985.03.31
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 CUNNINGHAM, GEORGE FREDERICK, JR.;LEWIS, JOHN WAYNE;MCCLURE, ROBERT BERNARD;POINDEXTER, DANIEL JOHN
分类号 C23F4/00;H01L21/00;H01L21/302;H01L21/3065;H01L21/673;H01L21/687;(IPC1-7):H01L21/306;H01L21/68;H01J37/32 主分类号 C23F4/00
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