发明名称 Rapid annealing under high pressure for use in fabrication of semiconductor device
摘要 For preventing a semiconductor substrate from a heat attack, a method of rapid annealing using a lamp unit for a heat radiation comprises the step of preparing a semiconductor substrate having a multiple-layer structure and a vessel having an annealing chamber where the lamp unit is placed, the vessel is associated with an inert gas supplying system operative to supply a high-pressure inert gas to the annealing chamber, and the above step is followed by the steps of placing the semiconductor substrate in the annealing chamber, supplying the high-pressure inert gas to the annealing chamber so as to create a high-pressure inert ambient within a predetermined range and activating the lamp unit for the heat radiation so as to heat up the semiconductor substrate, so that the heat radiation is decreased in intensity by virtue of the high-pressure inert ambient.
申请公布号 US4845055(A) 申请公布日期 1989.07.04
申请号 US19880194962 申请日期 1988.05.17
申请人 YAMAHA CORPORATION 发明人 OGATA, TAKASHI
分类号 H01L21/26;H01L21/00;H01L21/268 主分类号 H01L21/26
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