发明名称 |
Quantitative light microscope using a solid state detector in the primary image plane |
摘要 |
A solid state microscope for viewing and scanning microscopic objects. The solid state microscope has a light source with a condensor and diffusion filter. A moveable stage is provided to allow X, Y, Z plane displacements in order to scan objects under the microscope. There is an objective to magnify the image of the object and project this image onto a two dimensional solid state image sensor. The solid state image sensor sends signals to an analog-to-digital converter where the signals are digitized and sent to a frame memory. A monitor is used to display the image of the object as stored in frame memory. The present invention can be interfaced with a computer to allow for automatic focusing and scanning of an image. The computer also houses storage means to store images. Methods of scanning an object are also described. A prism element can be used to obtain spectral scans of an object. In another scanning method, a first edge row of pixels is used to detect an object of interest in the scanned image. This first detection row activates an area of the sensor array at a later time to capture the entire image. In this way, only relevant information is collected and processed.
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申请公布号 |
US4845552(A) |
申请公布日期 |
1989.07.04 |
申请号 |
US19870087387 |
申请日期 |
1987.08.20 |
申请人 |
JAGGI, BRUNO;DEEN, MOHAMMED J.;PALCIC, BRANKO |
发明人 |
JAGGI, BRUNO;DEEN, MOHAMMED J.;PALCIC, BRANKO |
分类号 |
G01N21/59;G02B21/00 |
主分类号 |
G01N21/59 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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