发明名称 Semiconductor integrated circuit device
摘要 An IC device comprising a junction type field effect transistor of a back gate type and a bipolar device such as a bipolar transistor and a resistor made of impurity diffused region, wherein an extremely thin (in the order of 0.05-0.2 mu m) impurity doped surface region of a conductivity type same as that of a back gate region is formed at the surface of a surface channel region, and is separated from at least a drain region to sustain high breakdown voltage between gate region and the drain region; the impurity surface region serving to reduce noise and also enabling to achieve satisfactory characteristics of J-FET and also good ohmic characteristics of the resistor.
申请公布号 US4233615(A) 申请公布日期 1980.11.11
申请号 US19780933045 申请日期 1978.08.10
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 TAKEMOTO, TOYOKI;KOMEDA, TADAO;YAMADA, HARUYASU;INOUE, MICHIHIRO
分类号 H01L29/80;H01L21/337;H01L21/8222;H01L21/8248;H01L27/06;H01L29/78;H01L29/808;(IPC1-7):H01L29/80 主分类号 H01L29/80
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