发明名称 |
Semiconductor integrated circuit device |
摘要 |
An IC device comprising a junction type field effect transistor of a back gate type and a bipolar device such as a bipolar transistor and a resistor made of impurity diffused region, wherein an extremely thin (in the order of 0.05-0.2 mu m) impurity doped surface region of a conductivity type same as that of a back gate region is formed at the surface of a surface channel region, and is separated from at least a drain region to sustain high breakdown voltage between gate region and the drain region; the impurity surface region serving to reduce noise and also enabling to achieve satisfactory characteristics of J-FET and also good ohmic characteristics of the resistor.
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申请公布号 |
US4233615(A) |
申请公布日期 |
1980.11.11 |
申请号 |
US19780933045 |
申请日期 |
1978.08.10 |
申请人 |
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. |
发明人 |
TAKEMOTO, TOYOKI;KOMEDA, TADAO;YAMADA, HARUYASU;INOUE, MICHIHIRO |
分类号 |
H01L29/80;H01L21/337;H01L21/8222;H01L21/8248;H01L27/06;H01L29/78;H01L29/808;(IPC1-7):H01L29/80 |
主分类号 |
H01L29/80 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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