发明名称 Method of etching cavities and apertures in substrates and device for carrying out said method
摘要 Deep cavities and apertures can be obtained with little undercutting (great etching factor) by etching in an artificial gravitational field (under the influence of centrifugal or centripetal forces).
申请公布号 US4448635(A) 申请公布日期 1984.05.15
申请号 US19830463761 申请日期 1983.02.04
申请人 U.S. PHILIPS CORPORATION 发明人 KUIKEN, HENDRIK K.;TIJBURG, RUDOLF P.
分类号 H01L21/306;C23F1/00;C23F1/02;(IPC1-7):H01L21/30;B44C1/22;C03C15/00 主分类号 H01L21/306
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