| 摘要 |
Device for a hardness measuring instrument comprises a bar device having one end portion that supports a test body, a middle portion that is pivotable about a pivot center, and a second end portion. The device has a gently lowerable measuring device which works on the basis of probes for measuring the thickness of thin layers. At the second end portion of the bar device there is a movable first part of an oscillation damping device, the longitudinal extension of which is aligned with the direction of movement of the test body.
|
