FRINGE SCAN TYPE PHASE INTERFEROMETER,申请号JP19870319633-传众专利搜索

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发明名称	FRINGE SCAN TYPE PHASE INTERFEROMETER
摘要
申请公布号	JPH01161110(A)	申请公布日期	1989.06.23
申请号	JP19870319633	申请日期	1987.12.17
申请人	TOKYO SEIMITSU CO LTD	发明人	NOGUCHI TAKASHI;KUROSAWA TOSHIRO
分类号	G01B9/02;G01B11/24	主分类号	G01B9/02
代理机构		代理人
主权项
地址

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