发明名称 TEST SYSTEM FOR LOGICAL DEVICE
摘要 PURPOSE:To enable an operator to study the factor of an error by monitoring the executing time of a diagnostic program via a monitor program and reporting the error information on a test in case some abnormality is produced during execution of the test and the normal run of the diagnostic program is impossible. CONSTITUTION:An operating system 11 controls a program which runs on a data processor and an operator carries out a monitor program 12 under the control of the system 11. Thus the program 12 starts a diagnosis program 13 for test of a logical device. The program 12 can monitor and acquire the executing time of the program 13. Then the program 12 monitors the executing time of the program 13 and reports the error information to the operator in case the program 13 has some abnormality and the normal run of the program 13 is impossible. Thus the operator can study the error factor.
申请公布号 JPH01156837(A) 申请公布日期 1989.06.20
申请号 JP19870316765 申请日期 1987.12.14
申请人 NEC CORP 发明人 MATSUHASHI TAKAHITO
分类号 G06F11/22 主分类号 G06F11/22
代理机构 代理人
主权项
地址