发明名称 Test probe accessibility method and tool
摘要 A method and tool for use with "bed of nails" fixturized automatic test equipment for printed circuit cards for verifying the continuity of component pins with the test nails of the system where the pins of the component are not accessible from the component side of the card. A tool is affixed beneath the component to short out all of the pins thereof and a node accessible from the component side of the board that makes contact with one or more of the pins of the component (such as power or ground) is probed with the continuity probe of the system while a continuity test is performed with respect to each of the test nails associated with the pins and nodes of the component.
申请公布号 US4841231(A) 申请公布日期 1989.06.20
申请号 US19870114918 申请日期 1987.10.30
申请人 UNISYS CORPORATION 发明人 ANGELUCCI, ERNEST A.
分类号 G01R1/073;G01R31/02 主分类号 G01R1/073
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