发明名称 WAFER CHUNCK COMPRISING A CURVED REFERENCE SURFACE
摘要 <p>SEMICONDUCTOR WAFER PROCESSING A chuck for holding a workpiece (e.g., a semiconductor wafer) in a vacuum comprises a curved reference surface. By clamping the edges of the workpiece and maintaining its backside against the curved surface (or against pins mounted on the surface), the frontside of the workpiece can be thereby established in a precise equidistant relationship with respect to the reference surface. Such a chuck is advantageous for holding wafers to be lithographically patterned in a high-resolution way by electron-beam, ion-beam and X-ray-beam techniques.</p>
申请公布号 CA1255814(A) 申请公布日期 1989.06.13
申请号 CA19870535610 申请日期 1987.04.27
申请人 AMERICAN TELEPHONE AND TELEGRAPH COMPANY 发明人 FELDMAN, MARTIN
分类号 G03F7/20;H01L21/027;H01L21/683;(IPC1-7):H01L21/68 主分类号 G03F7/20
代理机构 代理人
主权项
地址