发明名称 DELAY TIME MEASURING CIRCUIT
摘要 PURPOSE:To obtain the title circuit with a high accuracy and simple constitution by providing plural standard delaying circuits which are connected to a pulse signal generator and whose delaying times are known, a multipoint changeover switch to select respective output signals of a pulse generator and a measured circuit, etc. CONSTITUTION:By a multipoint changeover switch 19, standard delaying circuits 18 whose delaying times are known beforehand are successively selected. A selected delaying pulse signal is supplied to a data signal input side D of a first FF 23, and simultaneously, a pulse signal delayed through a variable delaying circuit 20 is supplied to the clock signal input side of the FF 23. At such a time, an impressed voltage to the circuit 20 when the signal of a logic 1 is outputted from an output side Q of the FF 23 with the probability of 1/2 is recorded. When measurements as to all of the circuits 18 are completed, the relational expression of the impressed voltage and delaying time is obtained. Next, the output side of a pulse signal generator 11 is selected, and the delaying time of the circuit 20 to satisfy the same conditions is obtained from the relational expression. In the same way, the output side of a measured circuit 12 is selected, the delaying time of the circuit 20 to satisfy the same conditions is obtained, a difference between both delaying times is obtained, and it is made into the delaying time of the circuit 12.
申请公布号 JPH01143978(A) 申请公布日期 1989.06.06
申请号 JP19870302147 申请日期 1987.11.30
申请人 ADVANTEST CORP 发明人 SUGITA TAKAYUKI;KITAYOSHI HITOSHI
分类号 G01R31/26;G01R31/28;H03K5/13 主分类号 G01R31/26
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