| 摘要 |
<p>An apparatus for testing circuit cards comprises a support plate (9), contact members (13) supported by the support plate and forming part of contact devices adapted to enter into contact with electrically conducting places on the circuit card, a device for pressing of the circuit card and the contact devices against each other, and contact elements (40) provided with sockets (41) and contact members for releasable connection to contact members (13) on the side of the support plate which faces away from the location of the circuit card during testing, said contact members being connected to electrical conductors (39). Strip like support members (43) are each adapted to support the sockets (41) of at least two adjacent contact elements (40) so that these sockets in their turn support the support plate (9) whereas the conductors (39) to the contact members in the sockets extend in spaces between two respective adjacent support members.</p> |
