Method for the determination of the phosphorus content in metal coatings deposited by electroless plating

摘要

The invention relates to a method for the nondestructive and non-contact simultaneous determination of the phosphorus content and the mass per unit area of metal coatings deposited by electroless plating based on XRF analysis and is suitable, for example, for the determination of the phosphorus content of nickel layers on metallic substrates. The intensity of the fluorescent radiation emitted by the layer and the intensity of at least one fluorescent radiation component of the substrate are measured separately, the dependence of the two measured parameters on the mass per unit area of a phosphorus-free layer is determined and the phosphorus content and the mass per unit area are calculated by means of analytical approximation relationships in which constants occur as free parameters whose numerical values are determined by means of samples having a known mass per unit area and having a known phosphorus content or by means of computer simulations.