发明名称 Method of detecting inclination of a specimen and a projection exposure device as well as method of detecting period of periodically varying signal
摘要 A method for detecting a period of a periodically varying signal and/or an inclination of a specimen utilizing an exposure apparatus wherein a coherent light is divided into first and second lights and the first light is irradiated onto the specimen at a predetermined angle, and a reflected light thereof and a reference light as the second light interfere with each other so as to form interference fringes, the interference fringes are detected, and the inclination of the specimen is detected from a pitch representing a period of the interference fringes. The method includes detecting a spectrum of a signal intensity obtained from the detected interference fringes or the periodically varying signal, subjecting the detected spectrum data to a fast complex Fourier transformation, calculating a true spectrum peak position jR in accordance with a relationship jR=j0+ DELTA , where j0 is a detected spectrum peak position and DELTA is a correcting value estimated from the Fourier transformed spectrum data adjacent to j0, and calculating the pitch P of the period of the signal intensity information in accordance with a relationship P=N/jR, where N is the number of sample data points for the complex Fourier transformation. Further, the method includes calculating the inclination of the specimen from the pitch P.
申请公布号 US5392115(A) 申请公布日期 1995.02.21
申请号 US19920936661 申请日期 1992.08.28
申请人 HITACHI, LTD. 发明人 OSHIDA, YOSHITADA;NINOMIYA, TAKU;KUROSAKI, TOSHIEI
分类号 G03F9/00;(IPC1-7):G01B9/02 主分类号 G03F9/00
代理机构 代理人
主权项
地址