发明名称 Topography measuring apparatus.
摘要 <p>In a contour measuring apparatus (9) a plurality of light beams is directed onto the surface (13) to be measured. The light beams are reflected through a lens (15) onto a photodetector (19) to produce measurable images. The images are analyzed to determine the local radius of curvature of the surface at each desired point of incidence of individual light beams and the three-dimensional surface contour of the surface being measured. In order to reduce instrument errors a calibration surface with a known contour is positioned in substitution of the surface being measured. A computer (24) sequentially determine and store a memory of the location of the calibration surface and compare the reflection of the light from the calibration surface as well as the surface being measured to determine the contour of the surface being measured.</p>
申请公布号 EP0317768(A1) 申请公布日期 1989.05.31
申请号 EP19880117544 申请日期 1988.10.21
申请人 TAUNTON TECHNOLOGIES, INC. 发明人 YODER, PAUL R., JR.
分类号 A61B3/10;A61B3/107;A61B3/15;G01B11/255 主分类号 A61B3/10
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