发明名称 Ion-projection apparatus
摘要 An ion-projecting apparatus which has between the ion source and the mask, directly proximal to the mask, at least one ion optical correction element in the form of a multipole with at least eight poles and so located that there is no other deflection means between the octapole and the mask.
申请公布号 US4835392(A) 申请公布日期 1989.05.30
申请号 US19870123128 申请日期 1987.11.20
申请人 IMS IONEN MIKROFABRIKATIONS SYSTEME GESELLSCHAFT M.B.H. 发明人 LOESCHNER, HANS;STENGL, GERHARD
分类号 H01J37/08;H01J37/12;H01J37/147;H01J37/30 主分类号 H01J37/08
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