发明名称 Process for the passivation of crystal defects
摘要 A process for the passivation of crystal defects or grain boundaries or internal grain defects or surfaces in an electrically conductive material in a plasma, where the passivation is carried out by the influence of suitable ions on the electrically conductive material to facilitate a shorter process time and lower stress on the electrically conductive material. A high-frequency gas discharge plasma is acted upon by a superimposed d.c. voltage which serves to accelerate the ions, suitable to carry out the passivation, towards the electrically conductive material.
申请公布号 US4835006(A) 申请公布日期 1989.05.30
申请号 US19870107442 申请日期 1987.10.13
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 GRASSER, HEINRICH;MUENZER, ADOLF
分类号 B01J19/08;C30B31/22;C30B33/00;C30B33/04;H01L21/30;H01L31/18 主分类号 B01J19/08
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