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经营范围
发明名称
BUILT-IN SELF-TEST SYSTEM FOR VLSI CIRCUIT CHIPS.
摘要
申请公布号
EP0245463(A4)
申请公布日期
1989.05.26
申请号
EP19860907130
申请日期
1986.11.07
申请人
ETA SYSTEMS, INC.
发明人
RESNICK, DAVID, R.;BACH, RANDALL, E.
分类号
G01R31/317;G01R31/28;G06F11/27;(IPC1-7):G01R31/28
主分类号
G01R31/317
代理机构
代理人
主权项
地址
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