发明名称 ELECTRONIC CIRCUIT WITH TEST FUNCTION
摘要 PURPOSE:To reduce external terminals for controlling a test circuit and make test easy by a method wherein all control signals are made at the same level and these signals are sequentially picked up one by one to be at a specific level. CONSTITUTION:In order to individually test m circuit parts 1a, 2a,...ma constituting a data processing circuit EC, parallel registers 1, 2,...m are provided on the output side and a control circuit CNT is installed to control said registers. The circuit CNT has m+1 reset-latch circuits, m NOR circuits, external terminals IC1, IC2 and m output terminals OC1-OCm. When a reset signal having level H is input to the terminal IC2, the circuit CNT forms a means for unifying the level, making control signals C1-Cm which are given from the terminals OC1-OCm to the parallel registers 1-m all at the same level L. When a control clock signal of level H is input to the terminal IC1, the circuit CNT forms a means of sequential selection, and only one control signal sequentially selected is set to level L.
申请公布号 JPH01132979(A) 申请公布日期 1989.05.25
申请号 JP19870291343 申请日期 1987.11.17
申请人 MITSUBISHI ELECTRIC CORP 发明人 SEGAWA HIROSHI
分类号 G06F11/22;G01R31/28;G01R31/3185 主分类号 G06F11/22
代理机构 代理人
主权项
地址