Semiconductor device having a test circuit,申请号US19870111741-传众专利搜索

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发明名称	Semiconductor device having a test circuit
摘要
申请公布号	US4833395(A)	申请公布日期	1989.05.23
申请号	US19870111741	申请日期	1987.10.23
申请人	FUJITSU LIMITED	发明人	SASAKI, TAKESHI;MONMA, HIDEO
分类号	G01R31/28;G01R31/3185	主分类号	G01R31/28
代理机构		代理人
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