发明名称 Probe for in-circuit emulator
摘要 A probe for an in-circuit emulator comprising a flexible substrate composed of a base film, a pattern provided on a central portion of the base film, plastic parts mounted on both ends of the base film, a connecting element detachably provided at one end of the flexible substrate, and reinforcing members mounted on the plastic parts.
申请公布号 US4832621(A) 申请公布日期 1989.05.23
申请号 US19870009157 申请日期 1987.01.30
申请人 ANDO ELECTRIC CO., LTD. 发明人 ASAI, HIRONOBU;OIKAWA, TAKESHI
分类号 H01L21/66;G01R1/06;G01R1/073;G01R31/26;G01R31/28;H01B7/08;H01R11/00;H05K1/00;H05K3/28 主分类号 H01L21/66
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