发明名称 PREPARATION OF INSPECTION DATA FOR LOGIC CIRCUIT PRINTED SUBSTRATE
摘要 PURPOSE:To curtail the circuit examination man-hour and to improve the operation efficiency by predicting a fault detection rate at the time of preparing an inspection data, based on a ratio which the number of pieces of parts belonging to the operation difficult parts kind occupies in a logic circuit printed board. CONSTITUTION:First of all, in a step 1, a predicted fault detection rate is derived, based on a circuit data. In a step 3, whether the predicted fault detection rate derived in the step 1 can satisfy an automatic preparing method or not is decide. When it can satisfy, an inspection data is prepared automatically, based on a circuit data in a step 4, and in a step 5, by executing a fault simulation and verifying the inspection data, a fault detection rate is derived. On the other hand, in case when said rate cannot satisfy, an addition of the inspection data and a fault simulation work by a person's help are repeated until a satisfactory fault detection rate is obtained. Also, when it is decided not to be a satisfactory predicted fault detection rate in the step 3, the inspection data is prepared by a person's help in step 6, the fault simulation is executed in a step 7, and the step 6 the step 7 are repeated until a satisfaction is obtained.
申请公布号 JPH01127977(A) 申请公布日期 1989.05.19
申请号 JP19870285502 申请日期 1987.11.13
申请人 OKI ELECTRIC IND CO LTD 发明人 YAMASHITA TAKAO;IGUSHI YASUNOBU
分类号 G06F11/22;G01R31/28;G01R31/317;G06F17/50;H05K3/00;H05K13/08 主分类号 G06F11/22
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