| 摘要 |
PURPOSE:To arbitrarily and automatically generate a test flaw detecting data of a data processor in a short time by inputting a prescribed parameter from a console display by a man-machine processing. CONSTITUTION:Five functions of index data setting, condition data setting, DAC data setting, flaw detecting data setting and F/S data printing can be selected from a menu screen. As for the index data setting, the condition data setting and the DAC data setting, each item is set successively from a console display 12. When these data are set once, it is unnecessary to set them thereafter, and they can be applied by only changing them partially in accordance with necessity. Subsequently, as for setting of the flaw detecting data, when an echo height patter determined in advance is set, the flaw detecting data can be generated by an automatic generating device 11 in accordance with the determined pattern. Also, as for the echo height pattern, when the maximum value and the minimum value are given as an initial value, the data generation corresponding to its pattern is executed within an echo detection range thereafter. |
