| 摘要 |
PURPOSE:To delete the scattered X rays, the veil glare and other artifact by comparing the picture data on each picture element obtained for each frame with the comparison cut-off value having the prescribed relation with the minimum value of the frame. CONSTITUTION:The (n) frames of the original multislit assembly MSA picture data 102 are obtained by a picture input device 100 and stored in a picture memory 104. An Imin deciding device decides the minimum value Imin to the (n) frames of the picture data. Then a cut-off surface is decided by a cut-off level deciding device 108 and stored in a brain memory 110. Those cut-off surfaces are read concurrently out of the memory 110 and applied to a threshold value deciding device 112. The device 112 checks whether the picture elements of the (n) frames of the picture data exceed the cut-off value or not. For the signal whose value higher than said cut-off value is detected, the scattered X rays and the veil glare are deleted by a primary component calculating device 113 and the calculation is carried out for production of the primary component. |
