发明名称 BEAM MONITOR FOR SYNCHROTRON EMITTED LIGHT
摘要 PURPOSE:To simplify the structure of a device by using the reverse surface of a thin plate as a fluorescent plate and measuring the position of synchrotron emitted light by its fluorescence. CONSTITUTION:The synchrotron emitted light 1 passes through the thin plate 2 to make part of the fluorescent surface 3 on its reverse side where the beam passes fluorescence, and the position of the beam is measured. The brightness of the fluorescence is adjusted by selecting the material and thickness of the thin plate 2 properly to obtain proper brightness. Consequently, the position of the synchrotron emitted light is measured by the simple constitution and this monitor is fitted even in a narrow place and easily operated.
申请公布号 JPH01124716(A) 申请公布日期 1989.05.17
申请号 JP19870282216 申请日期 1987.11.10
申请人 NEC CORP 发明人 FUJII KIYOSHI
分类号 G01J1/02;G01J1/58;H05H13/04 主分类号 G01J1/02
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