发明名称 |
Easily cascadable and testable cache memory |
摘要 |
The disclosure relates to a cache memory formed on a single chip wherein the ability to test the address comparator, cache memory diagnostics are improved, cache memory are capable of being read out. The architecture comprises a parity generator, a parity checker, a comparator and an SRAM memory cell array. The cache memory is cascadable for access to an increased address range and to provide increased memory capacity. |
申请公布号 |
US4831625(A) |
申请公布日期 |
1989.05.16 |
申请号 |
US19860940369 |
申请日期 |
1986.12.11 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
CHIU, EDISON H.;PANG, ROLAND H. |
分类号 |
G06F11/10;G06F12/08;G11C7/20 |
主分类号 |
G06F11/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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