发明名称 Easily cascadable and testable cache memory
摘要 The disclosure relates to a cache memory formed on a single chip wherein the ability to test the address comparator, cache memory diagnostics are improved, cache memory are capable of being read out. The architecture comprises a parity generator, a parity checker, a comparator and an SRAM memory cell array. The cache memory is cascadable for access to an increased address range and to provide increased memory capacity.
申请公布号 US4831625(A) 申请公布日期 1989.05.16
申请号 US19860940369 申请日期 1986.12.11
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 CHIU, EDISON H.;PANG, ROLAND H.
分类号 G06F11/10;G06F12/08;G11C7/20 主分类号 G06F11/10
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