发明名称 SEMICONDUCTOR MEMORY
摘要 PURPOSE:To prevent the formation of a channel on the side surface of a transistor, by arranging a first electrode and a second electrode in a trench to form a capacitance, via an insulating film. CONSTITUTION:On the outer peripheral part of a semiconductor substrate 1, a trench 19 is formed, in which a capacitor C is formed. On the side surfaces of transistors 9-12 formed in a memory cell region, a first electrode 5 is formed via an insulating film 4. A second electrode 7 connecting with the drain 12 of the transistors 9-12 is formed via a second insulating film 6, so as to cover the first electrode 5. Thereby it can be always prevented that a channel is formed on the side surfaces of transistors, even in the case where the electric potential of the second electrode 7 is higher than that of a common wiring part 14. Further, since the peripheral length of a capacitor can be made long, the capacitance can be made large, even if the area of memory cell is made small.
申请公布号 JPH01123462(A) 申请公布日期 1989.05.16
申请号 JP19870281382 申请日期 1987.11.06
申请人 SHARP CORP 发明人 IGUCHI KATSUJI;URAI MASAHIKO;SHIGA CHIYAKO
分类号 H01L27/10;H01L21/822;H01L21/8242;H01L27/04;H01L27/108 主分类号 H01L27/10
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