| 摘要 |
A multigigahertz probe for testing electrical micro connections or wafers. A body has a top, bottom and a testing tip at one end, and the one end slants upwardly and inwardly from the bottom towards the top. At least one coaxial cable is carried by the body and includes a first connector end and a second testing end forming testing contacts. The testing end extends to the intersection of the bottom and the slanting one end of the body.
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