发明名称 TEMPERATURE MONITORING DEVICE
摘要 <p>PURPOSE:To detect an abnormality by providing an oscillating means whose oscillation frequency is varied in accordance with a variation of a temperature and obtaining a temperature monitoring signal by comparing the oscillation frequency of the oscillating means and the reference frequency. CONSTITUTION:An LSI 1 is provided with an RC oscillator 3 connected to an external capacitor 2, a reference value register 11 for inputting reference count value data 9 from the outside and a comparator 14 for comparating a count value of a counter 5 and a count set value 13, etc. Subsequently, when the LSI 1 becomes an abnormal high temperature, a resistance value of the circuit 3 becomes high, and an oscillation wave number becomes low. Also, at the time point when an abnormal sampling signal 17 is outputted by a fall of a gate signal 8, a difference between the count value 12 and the count value 13 becomes >=3, therefore, a comparing signal 15 becomes a logical value '1', and an abnormality signal 19 is informed to an external device from a flip-flop 18. Accordingly, an abnormal temperature in the device can be detected.</p>
申请公布号 JPH01114728(A) 申请公布日期 1989.05.08
申请号 JP19870272201 申请日期 1987.10.28
申请人 NEC CORP 发明人 TAKEYA YUJI
分类号 G01K7/24;G06F1/00;G06F1/20;H01L21/66 主分类号 G01K7/24
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