A temperature control instrument for electronic components under test.

摘要

An instrument for controlling the temperature of electronic components under test. The instrument creates a testing environment in an enclosure within which the component contacts directly the active face of a set of back-to-back Peltier cells. Heating and cooling of the component under test is readily easily achieved by controlling the Peltier cells and test components may be easily interchanged using a removable mounting assembly. The instrument has the advantages of being small (portable), easy to operate, inexpensive to manufacture and to run and of producing very little electrical noise.