发明名称 Apparatus and method for slicing a wafer.
摘要 <p>An apparatus (10) and a method for slicing a cylindrical semiconductor ingot (34) into thin wafer pieces using an inner peripheral slicing blade (14). In the wafer slicing apparatus (10) and method, a grind stone shaft (62) with a grind stone (16) mounted to the tip end thereof is located movably axially within a rotor (38) provided with the inner peripheral slicing blade (14) and the grind stone shaft (62) and rotor (38) can be rotated integrally. The grind stone (16) and slicing blade (14) are arranged efficiently, so that , after the semiconductor ingot (34) is sliced with the slicing blade (14), the grind stone approaches the end face of the ingot (34) to grind it. This can save a lapping step, thereby improving a working efficiency.</p>
申请公布号 EP0313714(A1) 申请公布日期 1989.05.03
申请号 EP19880101301 申请日期 1988.01.29
申请人 TOKYO SEIMITSU CO.,LTD. 发明人 KATSUO HONDA;SUSUMU SAWAFUJI
分类号 B24B7/22;B24B27/06;B28D1/00;B28D5/02 主分类号 B24B7/22
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