发明名称 |
Method of selective reactive ion etching of substrates. |
摘要 |
<p>A method of image transfer into a substrate by reactive ion etch technique is provided. A mask layer on said substrate is formed by a spin-on film which film is comprised of a mixed organo-functional zircoaluminate or zircotitanate material. The film is dried and cured, and thereafter coated with a radiation sensitive resist. The resist is image wise exposed and developed, which developing preferably also removes the pattern in the mask exposing the substrate. The substrate is then reactive ion etched, the remaining film acting as a barrier material to the etching.</p> |
申请公布号 |
EP0314599(A2) |
申请公布日期 |
1989.05.03 |
申请号 |
EP19880480049 |
申请日期 |
1988.09.27 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
DESILETS, BRIAN HENRY;KAPLAN, RICHARD DEAN;SACHDEV, HARBANS SINGH;SACHDEV, KRISHNA GANDHI;SANCHEZ, SUZAN ANN |
分类号 |
H01L21/302;G03F7/09;H01B13/00;H01L21/3065 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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