发明名称 Trench etching process.
摘要 <p>A trench etching process comprises the steps of: preparing a substrate, forming a mask pattern for the trench etching having a material different from that of the substrate directly on the substrate, detecting changes in results of emission spectroanalyses generated by etching the mask pattern and the substrate, and determining that the trench etching is completed when a predetermined change in the spectroanalysis results occurs. Having the mask material deposited directly on the substrate enables a uniform trench depth to be achieved.</p>
申请公布号 EP0314522(A2) 申请公布日期 1989.05.03
申请号 EP19880310219 申请日期 1988.10.31
申请人 FUJITSU LIMITED 发明人 MOTOYAMA, TAKUSHI;ABE, NAOMICHI;MIHARA, SATORU
分类号 H01L21/302;H01L21/3065;H01L21/308 主分类号 H01L21/302
代理机构 代理人
主权项
地址