摘要 |
PURPOSE:To exactly detect the real defect of a printed board by setting the detecting condition of a defect detecting means so as to be over-detection and checking the wiring pattern image of a detected defect part with an original image. CONSTITUTION:The wiring pattern image of a printed board PWP to be scanned by a scan optical system 1 is converted to a binarizing picture signal. An image memory 2 stores this signal with solution to correspond to an operator 30 to be composed of the matrix of (m)X(n) picture element. A defect detecting module 31 is composed of the memory of a ROM, etc., and the wiring pattern is scanned by the operator 30. Then, the defect of a lacking and projecting of a wiring and the information of a segment position are outputted from the output. A checking part 4 reads the original image of the segment position of the defect part from an original image storing part 5 and compares it with the wiring pattern of the defect part. As the result, when the both of them are coincident, the defect to be over-detected is obtained and when they are not coincident, the defect is decided as the real defect. Thus, the real defect can be exactly decided. |