发明名称 |
RESIN-SEALED SEMICONDUCTOR DEVICE |
摘要 |
<p>PURPOSE:To prevent a bonding wire from being stripped off due to a difference in thermal expansion between a semiconductor substrate and a resin block by a method wherein a protective film is formed on the surface of the semiconductor substrate and a resin film having two or more openings is formed between the substrate and the resin block. CONSTITUTION:A protective film 5 is formed on a semiconductor substrate chip 1 where a device and a wiring part have been formed; a polyimide film 10 is formed on the protective film 5. Two or more openings 11 are formed in the polyimide film 10; the surface of the protective film 5 is exposed inside the openings 11. Accordingly, because a resin block 2 is bonded to the protective film 5 inside the openings 11, expansion of the resin block 2 due to a rise in temperature is suppressed by the semiconductor substrate chip 1; a whole part of the expansion in a transverse direction of the resin block 2 as caused in a conventional structure is not concentrated on a part of a contact hole 6. By this setup, a bonding wire 4 is pushed in the transverse direction; it is possible to prevent the bonding wire from being stripped off from a pad 7.</p> |
申请公布号 |
JPH01111339(A) |
申请公布日期 |
1989.04.28 |
申请号 |
JP19870269753 |
申请日期 |
1987.10.26 |
申请人 |
FUJITSU LTD;FUJITSU VLSI LTD;FUJITSU MIYAGI ELECTRON:KK |
发明人 |
TAKASUKA YUTAKA;OKADA MASAKI;TAKEYAMA HISASHI |
分类号 |
H01L21/312;H01L21/31;H01L23/29;H01L23/31 |
主分类号 |
H01L21/312 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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