发明名称 ELECTRON MICROSCOPE
摘要 An electron microscope has a two-dimensional sensor located at the image-formation plane. The two-dimensional sensor stores electron beam energy and emits light upon exposure to light or heat. The filament is located at a position displaced from the principal optical axis of the electron beam so that the image of the filament may not be recorded on the two-dimensional sensor. The two-dimensional sensor is, for example, made of stimulable phosphor.
申请公布号 DE3569063(D1) 申请公布日期 1989.04.27
申请号 DE19853569063 申请日期 1985.10.17
申请人 FUJI PHOTO FILM CO., LTD. 发明人 MORI, NOBUFUMI C/O FUJI PHOTO FILM CO., LTD.;HOSOI, YUICHI C/O FUJI PHOTO FILM CO., LTD.;MIYAHARA,JUNJI C/O FUJI PHOTO FILM CO., LTD.
分类号 H01J37/22;H01J37/26;(IPC1-7):H01J37/26;G03B42/02 主分类号 H01J37/22
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