CONTACT PROBE FOR A TESTING HEAD HAVING VERTICAL PROBES FOR SEMICONDUCTOR INTEGRETED ELECTRONIC DEVICES,申请号PL20050383571-传众专利搜索

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发明名称	CONTACT PROBE FOR A TESTING HEAD HAVING VERTICAL PROBES FOR SEMICONDUCTOR INTEGRETED ELECTRONIC DEVICES
摘要
申请公布号	PL383571(A1)	申请公布日期	2008.03.17
申请号	PL20050383571	申请日期	2005.04.12
申请人	TECHNOPROBE S.P.A.	发明人	CRIPPA GIUSEPPE;FELICI STEFANO
分类号	G01R1/067;G01R1/073	主分类号	G01R1/067
代理机构		代理人
主权项
地址

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