发明名称 Radiation hardened semiconductor devices
摘要 Disclosed are semiconductor devices and circuits which are highly resistant to the effects of radiation. A thin conductive layer, which is biased at substrate potential, and a thin oxide are provided under the usual field oxide of the devices. The conductive layer shields the semiconductor substrate from the effects of charge generation in the field oxide due to radiation absorption.
申请公布号 US4825278(A) 申请公布日期 1989.04.25
申请号 US19870020771 申请日期 1987.03.02
申请人 AMERICAN TELEPHONE AND TELEGRAPH COMPANY AT&T BELL LABORATORIES 发明人 HILLENIUS, STEVEN J.;LYNCH, WILLIAM T.;MANCHANDA, LALITA
分类号 H01L21/765;H01L23/58;H01L23/60;H01L29/06;H01L29/40;(IPC1-7):H01L29/40 主分类号 H01L21/765
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