发明名称 Method for obtaining regions of dielectrically isolated single crystal silicon
摘要 A method of forming single crystal islands (30) by epitaxial growth from a monocrystalline substrate (10). A <100> or other suitable low index surface is preferentially etched to void an inverted pyramid section (16) with <111> or other suitable low index sidewalls (18). The <100> bottom (17) of the pyramid section is covered with insulation (20) and island refill material (24) is grown epitaxially from the sidewalls (18). The islands (30) are laterally isolated (25, 28) from the sidewalls (13) and the structure is finished to provide a substrate on which to form various IC devices.
申请公布号 US4824795(A) 申请公布日期 1989.04.25
申请号 US19870010924 申请日期 1987.02.05
申请人 SILICONIX INCORPORATED 发明人 BLANCHARD, RICHARD A.
分类号 H01L21/20;H01L21/762;(IPC1-7):H01L21/76;H01L21/26 主分类号 H01L21/20
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