发明名称 DEVICE FOR OBSERVING SURFACE CONDITION
摘要 PURPOSE:To enable observation dynamically by keeping the inside of a chamber, in which there is an electron gun, under an ultra-high vacuum, bringing the inside of a chamber, in which there is a sample, under a vacuum such as an arbitrary low vacuum and executing growth and etching. CONSTITUTION:An electron gun chamber 11 and a sample chamber 12 are partitioned by an orifice plate 15, electron rays from an electron gun 14 are passed through the orifice plate 15 and applied to a sample 18 in the sample chamber 12, and reflected electron rays 19 from the sample 18 are projected to a screen 17 in a screen-chamber adjacent to the sample chamber 12. The electron gun chamber 11 and the sample chamber 12 are respectively exhausted independently, and a plasma generator, etc., can be added to the sample chamber 12. The inside of the chamber, in which there is the electron gun 14, is kept under an ultra-high vacuum, the inside of the chamber, in which there is the sample 18, is brought to a vacuum such as an arbitrary low vacuum, and growth and etching can be executed, and an image equal to a normal RHEED on the screen 17 can be observed in the quite the same manner as an RHEED under the state.
申请公布号 JPH01106431(A) 申请公布日期 1989.04.24
申请号 JP19870262663 申请日期 1987.10.20
申请人 FUJITSU LTD 发明人 OKADA MAKOTO
分类号 G01N23/225;H01J37/305;H01L21/02;H01L21/302;H01L21/3065 主分类号 G01N23/225
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