发明名称 SYSTEM FOR COLLECTING FAULT INFORMATION
摘要 PURPOSE:To simplify a procedure to collect the fault information from the faulty devices and to shorten the fault information collecting time by reading out the processor fault information written into a main memory via a diagnosing device. CONSTITUTION:When the fault information are collected, a dump program is transferred to a control memory part 32-i of respective processors 3-i (i=1-n) from a diagnosing device 1. Then, the dump program is executed by a microprogram processing part 31-i for collection of the fault information out of each processor 3-i. The collected fault information are stored in a prescribed specific area of a main memory 2. The device 1 reads the fault information out of the memory 2. Thus, it is possible to simplify the procedure to collect the fault information from the faulty devices and also to shorten the collecting time of the fault information.
申请公布号 JPH01102649(A) 申请公布日期 1989.04.20
申请号 JP19870260569 申请日期 1987.10.15
申请人 NEC CORP 发明人 SAKAI SEIKI
分类号 G06F11/22 主分类号 G06F11/22
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