| 摘要 |
PURPOSE: A method for removing flicker noise of a CMOS(Complementary Metal Oxide Semiconductor) image sensor and a CMOS image sensor employing the method are provided to measure a period of an external light source to eliminate the flick noise. CONSTITUTION: A CMOS image sensor includes a main pixel part and a plurality of additional pixel parts. Different exposure time periods are respectively applied to the plurality of additional pixel parts to expose the pixel parts to an external light. An average value of outputs of each of the plurality of additional pixel parts is obtained for each frame during multiple frames. A variation in the average values is measured. Magnitudes of variations in the average values of the plurality of additional pixel parts are compared to detect a period of the external light(34,35). A value corresponding to integer times the period of the external light is used as exposure time of the main pixel part. |
