发明名称 STABILIZATION APPARATUS AND METHOD FOR X RAYS EMISSION LAYER THICKNESS METER
摘要 PURPOSE: To stabilize a measurement system during pause time generated at measurement time by providing a cylindrical plug for switching X-ray application direction due to turning in a proportional counting pipe stabilization device for measuring the thickness of X-ray light emission layer. CONSTITUTION: A metal structure 16 where a passage hole 17 is formed is provided at a hole part 13 of a container 11 that houses an X-ray source 12. A cylindrical plug 21 that can be fumed in a cylindrical gap 18 is provided in a structure 16. Also, an X-ray passage hole 23 and a cutting 28 are formed at the cylindrical plug 21. When the axial line of the passage hole 23 matches that of the passage hole 17 of the metal structure 16, the output X rays of an X-ray source 12 pass the passage holes 17 and 23 and are applied to a measurement target. When the plug 21 is turned, the passage hole 17 is closed by the plug 21, passes through a discharge pipe 31 formed at the metal structure 16, and is guided to a counting pipe 34.
申请公布号 JPH01101409(A) 申请公布日期 1989.04.19
申请号 JP19870236379 申请日期 1987.09.22
申请人 HERUMUUTO FISCHER GMBH & CO 发明人 HANSU HERUMAN BEENKE
分类号 G01N23/223;G01B15/02;G01T1/18;G01T7/00;G21K3/00 主分类号 G01N23/223
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