发明名称 WIRING DEVICE FOR SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PURPOSE:To obtain optimum electric characteristics by calculating and specifying the allowable delay time by a circuit designer and by connecting wire within the time range. CONSTITUTION:Resistance value R and value C of load capacity 7, 8 are obtained according to the necessary length and width of wiring 3, 4 which are determined by a conventional wiring process. If the product of these values is not within the range of the specified delay time, the wiring width or the wiring length are changed to control the product within the specified range. If the product is within the range, the wiring width and the wiring length are changed to get the optimum electric characteristics within the range. In this way, wiring circuit considering electric characteristics which are calculated manually in existing techniques can be made automatically and a precision wiring device for semiconductor integrated circuit can be provided at extremely low costs.
申请公布号 JPH0195535(A) 申请公布日期 1989.04.13
申请号 JP19870252973 申请日期 1987.10.07
申请人 MITSUBISHI ELECTRIC CORP 发明人 HOSOMI SHUNSUKE
分类号 H01L21/82;G06F17/50;H01L21/3205;H01L23/52;H01L27/02 主分类号 H01L21/82
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