| 发明名称 |
A system of measuring a state density in a semi-conductor element and a method using this system. |
| 摘要 |
<p>The system measuring a state density in a semi-conductor element comprises a pulse generator and a control unit for controlling size and shape of the pulses, such as to be able to measure state densities in the band gap of the semi-conductor element.</p> |
| 申请公布号 |
EP0311201(A1) |
申请公布日期 |
1989.04.12 |
| 申请号 |
EP19880202166 |
申请日期 |
1988.09.30 |
| 申请人 |
INTERUNIVERSITAIR MICROELECTRONICA CENTRUM VZW |
发明人 |
GROESENEKEN, GUIDO VALEER LEO;MAES, HERMAN EMILE MARIA |
| 分类号 |
G01R31/26;H01L21/66;(IPC1-7):G01R31/26 |
主分类号 |
G01R31/26 |
| 代理机构 |
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代理人 |
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| 地址 |
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