| 发明名称 |
Polarity compensated apparatus for measuring the impedance of a polar device |
| 摘要 |
This invention provides a polar device measuring apparatus which can bias a device under test in a proper polarity. The measuring apparatus is computer-controlled and automatically selects the polarity of the bias voltage based on the measured value of voltage across the device.
|
| 申请公布号 |
US4820969(A) |
申请公布日期 |
1989.04.11 |
| 申请号 |
US19880185602 |
申请日期 |
1988.04.22 |
| 申请人 |
HEWLETT-PACKARD COMPANY |
发明人 |
YONEKURA, TAKANORI;WAKASUGI, TOMIO |
| 分类号 |
G01R31/00;G01R31/26;(IPC1-7):G01R27/00;G01R27/14 |
主分类号 |
G01R31/00 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
|
| 地址 |
|
