发明名称 |
METHOD FOR PRODUCING PHOTOMASK, DRAWING DEVICE, INSPECTION METHOD FOR PHOTOMASK, INSPECTION DEVICE FOR PHOTOMASK AND METHOD FOR PRODUCING DISPLAY DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for producing a photomask capable of enhancing the coordinate precision of a pattern formed on a transferred body.SOLUTION: There is provided a method for producing a photomask which comprises: a step of preparing pattern design data A; a step of obtaining transfer surface shape data C exhibiting a deformation quantity on a main surface of a photomask caused by holding of the photomask in an exposure device; a step of obtaining height distribution data E during drawing exhibiting a height distribution of a main surface of a photomask blank in a state where the photomask blank is mounted on a stage of a drawing device; a step of obtaining drawing difference data F from a difference between the height distribution data E during drawing and the transfer surface shape data C; a step of determining drawing coordinate shift amount data G by calculating a coordinate shift amount corresponding to the drawing difference data F; and a drawing step of drawing a pattern on the photomask blank using the drawing coordinate shift amount data G and the pattern design data A.SELECTED DRAWING: Figure 7 |
申请公布号 |
JP2016151636(A) |
申请公布日期 |
2016.08.22 |
申请号 |
JP20150028311 |
申请日期 |
2015.02.17 |
申请人 |
HOYA CORP |
发明人 |
KENMOCHI DAISUKE |
分类号 |
G03F1/70;G03F1/84;H01L21/027 |
主分类号 |
G03F1/70 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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