APPARATUS FOR MEASURING THICKNESS

摘要

A thickness gauge of the kind consisting of a radiation source (10) producing a beam (12) aimed at a detector (14) whereby a material (20) to be gauged obstructs the radiation beam, so that the intensity of radiation received by the detector, and hence the detector output (1) varies and said variation can be translated into a thickness measurement (X). Standards (18) are used for calibration and computer means (16) ans methods provide better measurements by using a function relating the thickness to the detector output in a large range and independently of random inaccuracies of the standards.