Method and apparatus for testing an integrated circuit including a microprocessor and an instruction cache.

摘要

An integrated electronic circuit is provided comprising: a microprocessor for executing instructions; an instruction cache for storing instructions for execution by the microprocessor, the instruction cache being coupled to the microprocessor for transfer of respective stored instructions to the microprocessor; and circuitry for exchanging respective byte positions of at least two bytes of a respective instruction stored by the instruction cache.