发明名称 Silicide contact plug formation technique
摘要 An integrated circuit fabrication process for improving step coverage of the metal lines and of metal layer interconnections is disclosed. A conductive polysilicon, polycide, or polycide-on-polysilicon plug is formed in contact apertures by successive silicidation sequences of silicon/refractory metal deposition and heat treatment. A preceding silicide may also be removed prior to a succeeding silicidation to reduce silicon lining.
申请公布号 US4818723(A) 申请公布日期 1989.04.04
申请号 US19870119260 申请日期 1987.11.04
申请人 ADVANCED MICRO DEVICES, INC. 发明人 YEN, YUNG-CHAU
分类号 H01L21/285;H01L21/768;(IPC1-7):H01L21/283 主分类号 H01L21/285
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